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Volume 17
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Issue 5
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Electron irradiation effects on InP-based HEMTs with different gate widths
S. X. Sun
,
X. L. Fu
,
L. Wang
,
M. E
,
J. J. Yi
,
R. X. Yao
,
X. Y. Zheng
,
H. T. Wu
,
F Liu
,
Y. H. Zhong
,
Y. X. Li
,
P. Ding
,
Z. Jin
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J. Ovonic. Res.
2021
, 17(5), 411–420;
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