Article
Structural parameters determination of ALD-SnO2 thin films grown on silicon (100) and boron-doped silicon (100) substrates
J.
Rodríguez-López
,
R.
Rangel
,
J.
Lara-Romero
,
P.
Quintana-Owen
,
P.
Bartolo-Pérez
,
A.
Ramos-Carrazco
J. Ovonic. Res. 2024
, 20(5),
627–632;
https://doi.org/10.15251/JOR.2024.205.627